Products

The Fist-ever! Innovative technology for wafer-level GaN HV+HP dynamical measurement.
One positioner occupied only on Semi-Auto or Manual station.

We all know that currently there is no commercial solution for dynamic characterization of GaN Device.Our Dynamic characterization means to extract device parameters under switching operation (ex. 100kHz, 20% duty continuously) instead of static or multi-pulse.We will provide 1st total solution for dynamic reliability of GaN.

The DSA1010 Device Statics Analyzer can help developer to improve components, and it could also correctly evaluate the power loss and aging rate of components.

Do you know how to measure dynamic Rdson, dynamic Vth from trapping effect of GaN? In the face of high-voltage and high-current Dynamic testing requirements, we provided Device Dynamics Analyzer to solve the difficulty of dynamic analysis under programmable switching condition.