Device Dynamic Reliability Analyzer
In the face of high-voltage and high-current dynamic testing requirements, we provided
GaN Device Dynamics Analyzer to solve the difficulty of dynamic analysis under programmable
switching condition. Different from the parameter analyzer on the market, our Dynamic characterization means to extract device parameters under switching operation (ex. 100kHz, 20% duty continuously) instead of static or multi-pulse.Our GaN Device Dynamics Analyzer will provide 1st total solution for dynamic characterization of GaN which is capable to extract following parameters.
■ Dynamics under hard switching or soft switching
■ Switching On-Vg : -12V~12V for device benchmark
■ Switching Voltage : Up to 800V
■ Switching Frequency : Up to 300k Hz
■ Switching Duty : 10%~90%
■ Temperature : 25C~175C
■ Dynamic Rdson(HSW, ZVS), Dynamic HTOL (SALT)…
There are 3 characteristic features ：
Dynamics under hard-switching or soft-switching
Switching On-Vg:
-12V~12Vfor device benchmark.
Dynamic Vth under hard-switching or soft-switching.
Methodology to Evaluate System Lifetime
The specifications of our GaN Dynamic Reliability Analyzer are as follows：
◆ Switching On-Vg : -12V~12V for device benchmark◆ Switching Voltage : Up to 800V
◆ Switching Current : <10A
◆ Switching Frequency : Up to 300kHZ
◆ Switching Duty : 10%~90%
◆ Temperature : 25C~175C
◆ Characterization Items : Dynamic Rdson(HSW, ZVS), Dynamic HTOL (SALT), Pulse I-V…