ABOUT Yu Chen
Yu Chen Instrument Corp. is dedicated to advancing semiconductor equipment and precision measurement solutions, focusing on dynamic analysis for power semiconductor devices. Our Device Dynamic Analyzer, designed for high-voltage and high-current applications, addresses the complexity of analyzing Wide Band Gap(WBG) such as Gallium Nitride (GaN) and Silicon Carbide (SiC) devices under programmable switching conditions, providing a comprehensive solution for measuring Dynamic Rdson, Vth, and Vsd.
In addition to our Device Dynamic Analyzer, we offer the Device Dynamic Reliability Analyzer. This Power Device Analyzer is engineered for dynamic reliability testing, offering lifetime prediction under actual system operation. With the ability to analyze multiple GaN devices (Multi-DUT) simultaneously, our Dynamic Reliability Analyzer enables independent acceleration tests across five devices with real-time monitoring of key dynamic parameters.
Our solutions support both packaged and wafer-level GaN HV+HP measurements, empowering engineers and researchers with the accuracy, efficiency, and flexibility required to lead in the evolving semiconductor landscape. Whether you're developing cutting-edge power semiconductor devices or enhancing the performance of existing components, Yu Chen Instrument Corp. provides the tools for precise, reliable results.
